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11
Novel Robust Structure and High k Dielectric Material for 90 nm DRAM Capacitor
Novel Robust Structure and High k Dielectric Material for 90 nm DRAM Capacitor
Y.K. Park, | 대한전자공학회 | 2003 ,
12
Data Retention Time and Electrical Characteristics of Cell Transistor According to STI Materials in 90 nm DRAM
Data Retention Time and Electrical Characteristics of Cell Transistor According to STI Materials in 90 nm DRAM
S.H.Shin, | 대한전자공학회 | 2003 ,
13
Design of the PAL XFEL
Design of the PAL XFEL
J. Choi, | 한국물리학회 | 2007 ,
14
Study on the Binding Force Between λ-DNA and Various Types of Substrates
Study on the Binding Force Between λ-DNA and Various Types of Substrates
T. H. Nguyen, | 한국물리학회 | 2007 ,
15
Local Observation of Ferroeletric Bi(3.25)La(0.75)Tio(12) Thin Films by Atomic Force Microscopy
Local Observation of Ferroeletric Bi(3.25)La(0.75)Tio(12) Thin Films by Atomic Force Microscopy
T. Y. Kim, | 한국물리학회 | 2007 ,
16
Scanning force Microscopy of Relaxor Ferroelectric PbMg⅓Nb⅔O₃-PbTiO₃Thin films for Piezoelectric Sensors
Scanning force Microscopy of Relaxor Ferroelectric PbMg⅓Nb⅔O₃-PbTiO₃Thin films for Piezoelectric Sensors
J. H. Lee, | 한국물리학회 | 2007 ,
17
Advanced Microcolumn Operation for Low-Energy Electron-Beam Lithography
Advanced Microcolumn Operation for Low-Energy Electron-Beam Lithography
Y. C. Kim, | 한국물리학회 | 2006 ,
18
Structural Properties of CrN Buffers for GaN Growth
Structural Properties of CrN Buffers for GaN Growth
W. H. Lee, | 한국물리학회 | 2006 ,
19
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
Characterization of MBE-Grown ZnSe Thin Films by Using Photocurrent Spectroscopy
M. H. Jung, | 한국물리학회 | 2006 ,
20
Detection of Low Cycle Fatigue in Type 316 Stainless Steel using HTS-SQUID
Detection of Low Cycle Fatigue in Type 316 Stainless Steel using HTS-SQUID
D.G. Park, | 한국부식방식학회(구)한국부식학회 | 2004 ,
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