본문

  1. Home
2 Results:AA:YING-YING ZHANG 0.46 sec.
RSS 
Multilingual
 Расширенный поиск
 Новый поиск книги прибытия
Selected Print Select Export to Excel
1
Regular Paper : Stress Dependence of Thermal Stability of Nickel Silicide for Nano MOSFETs
Regular Paper : Stress Dependence of Thermal Stability of Nickel Silicide for Nano MOSFETs
Ying Ying Zhang, | 한국전기전자재료학회 | 2008 ,
2
Characterization of the dopant Dependence of Ni-silicide on a SOI Substrate for a Nano-Scale CMOSFET
Characterization of the dopant Dependence of Ni-silicide on a SOI Substrate for a Nano-Scale CMOSFET
Soon-Yen Jung, | 한국물리학회 | 2007 ,
처음1마지막