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1
A reference governor-based controller for a cable robot under input constraints.
A reference governor-based controller for a cable robot under input constraints.
So-Ryeok Oh, | Institute of Electrical and Electronics Engineers | 2005 ,
2
A computational approach for time-optimal planning of high-rise elevators
A computational approach for time-optimal planning of high-rise elevators
M. Schlemmer, | Institute of Electrical and Electronics Engineers | 2002 ,
3
The Claremont Report on Database Research
The Claremont Report on Database Research
Agrawal, R., | Association for Computing Machinery | 2009 ,
4
When More May Be Less:The Effects of Regulatory Focus on Responses to Maximal/Minimal Comparative Frames
When More May Be Less:The Effects of Regulatory Focus on Responses to Maximal/Minimal Comparative Frames
Jain, S, | Association for Consumer Research | 2007 ,
5
Two Novel Protein Kinase Genes, OsMSRPK1 and OsMSURPK2, Are Regulated by Diverse Environmental Stresses in Rice
Two Novel Protein Kinase Genes, OsMSRPK1 and OsMSURPK2, Are Regulated by Diverse Environmental Stresses in Rice
Mi Ok Lee, | 한국식물학회(Adventitous Root Formation | 2006 ,
6
In Search of Multimedia Courseware Development Environment for Effective Teaching Through Multimedia Courseware
In Search of Multimedia Courseware Development Environment for Effective Teaching Through Multimedia Courseware
D.S Karaulia, | 한국멀티미디어학회 | 2003 ,
7
The Feasible Workspace Analysis of a Set Point Control for a Cable-Suspended Robot With Input Constraints and Disturbances
The Feasible Workspace Analysis of a Set Point Control for a Cable-Suspended Robot With Input Constraints and Disturbances
S. R. Oh., | Institute of Electrical and Electronics Engineers | 2006 ,
8
When More May Be Less : The Effects of Regulatory Focus on Responses to Different Comparative Frames
When More May Be Less : The Effects of Regulatory Focus on Responses to Different Comparative Frames
Shailendra Protap Join., | University of Chicago Press | 2006 ,
9
Test generation for VLSI chips : Tutorial
Test generation for VLSI chips : Tutorial
Agrawal, Vishwani D., 569.3-V822t | IEEE Computer Soci | 1988 569.3-V822t,
10
Fault tolerant system design
Fault tolerant system design
Levi, Shem-Tov, 004.21-L664f | McGraw-Hill Book Company | 1994 004.21-L664f,
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