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Test generation for VLSI chips : Tutorial
Test generation for VLSI chips : Tutorial
상세정보
- 자료유형
- 단행본
- ISBN
- 0818647868
- 청구기호
- 569.3 V822t
- 서명/저자
- Test generation for VLSI chips : Tutorial / Vishwani D. Agrawal , Sharad C. Seth.
- 발행사항
- Los Alamitos, California : IEEE Computer Soci, 1988.
- 형태사항
- x, 401 p. : illus. ; 28 cm.
- 서지주기
- includes index.
- 기타저자
- Seth, Sharad C.
- 가격
- 40000
- Control Number
- kjul:50026917
MARC
008010917s1988 us a 001 eng■005 20010917151041.0
■020 ▼a0818647868
■035 ▼aKRIC00388284
■090 ▼a569.3▼bV822t
■1001 ▼aAgrawal, Vishwani D.
■24510▼aTest generation for VLSI chips▼bTutorial▼dVishwani D. Agrawal▼eSharad C. Seth.
■260 ▼aLos Alamitos, California▼bIEEE Computer Soci▼c1988.
■300 ▼ax, 401 p.▼billus.▼c28 cm.
■504 ▼aincludes index.
■7001 ▼aSeth, Sharad C.
■9500 ▼b40000
