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1
Reliability Issues and Role of Defects in High-k Dielectric HfO₂Devices
Reliability Issues and Role of Defects in High-k Dielectric HfO₂Devices
Joongoo Kang, | 한국물리학회 | 2007 ,
2
The Origin of P-Type Conductivity in P-doped ZnO
The Origin of P-Type Conductivity in P-doped ZnO
Woo-Jin Lee, | 한국물리학회 | 2007 ,
3
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Dae Yeon Kim., | 한국물리학회 | 2006 ,
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