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561
Package- and Wafer Level Electromigration Test on Al-Cu interconnect with Ti and TiN Underlayers
Package- and Wafer Level Electromigration Test on Al-Cu interconnect with Ti and TiN Underlayers
Young Bae Par, Dok Won Lee, | 대한금속.재료학회 | 2001 ,
562
Wetting Characteristics of CaO-SiO₂-Al₂O₃Ternary Slag on Refractory Oxides,Al₂O₃,SiO₂ and TiO₂
Wetting Characteristics of CaO-SiO₂-Al₂O₃Ternary Slag on Refractory Oxides,Al₂O₃,SiO₂ and TiO₂
Sung-Mo Seo,Dong-Sik Kim,Young Hyun Paik, | 대한금속.재료학회 | 2001 ,
563
Effects of Texture ans Grain Structure on Electromigration Lifetime of Al-Cu Interconnects
Effects of Texture ans Grain Structure on Electromigration Lifetime of Al-Cu Interconnects
Young Bae Park,Duk Won Lee, | 대한금속.재료학회 | 2001 ,
564
Characteristics of Tee Tube Forming Deformation Zone Using Plastic Pressure-Building Medium
Characteristics of Tee Tube Forming Deformation Zone Using Plastic Pressure-Building Medium
Debin Shan,Youngsuk Kim,Yan Lu, | 대한금속.재료학회 | 2000 ,
565
Microscopic Study for the Behavior of Grain Boundary Using Molecular Dynamics
Microscopic Study for the Behavior of Grain Boundary Using Molecular Dynamics
Young-Suk Kim,Dong-Youl Choi, | 대한금속.재료학회 | 2000 ,
566
Visual Cues as a Predictor for Better Design : An Intergrated Approach to Observers' Evaluation of Aesthetic Beauty
Visual Cues as a Predictor for Better Design : An Intergrated Approach to Observers' Evaluation of Aesthetic Beauty
Do Young Lee, | 대한건축학회 | 2002 ,
567
Housing Adjustment As a Sympom of Housing Dissatisfaction: Call for an Intergrated Approach to Theory Building
Housing Adjustment As a Sympom of Housing Dissatisfaction: Call for an Intergrated Approach to Theory Building
Do Young Lee, | 대한건축학회 | 2000 ,
568
College physics
College physics
Sears , Francis W., 420-S439c-안진홍 | Addison-Wesley Pub. Co. | 1985 420-S439c-안진홍,
569
Modern engineering economy
Modern engineering economy
Young, D., 325.8-Y69m-안진홍 | Wiley | 1993 325.8-Y69m-안진홍,
570
University physics
University physics
Young, Hugh D, 420-Y72u | Addison-Wesley Publishing Company | 1996 420-Y72u,
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