본문

  1. Home
652 Results:AA:J YEO 0.265 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
521
Large Magnetoelectric Effect and Low-Temperature Phase Transitions of DyMn₂O5 Ceramics
Large Magnetoelectric Effect and Low-Temperature Phase Transitions of DyMn₂O5 Ceramics
Sun Hee Kang, | 한국물리학회 | 2007 ,
522
Characterization of the dopant Dependence of Ni-silicide on a SOI Substrate for a Nano-Scale CMOSFET
Characterization of the dopant Dependence of Ni-silicide on a SOI Substrate for a Nano-Scale CMOSFET
Soon-Yen Jung, | 한국물리학회 | 2007 ,
523
Synthesis, Structural Characterization, and Photoluminescence Properties of SiOχ Nanowires Prepared Using a Palladium Catalyst
Synthesis, Structural Characterization, and Photoluminescence Properties of SiOχ Nanowires Prepared Using a Palladium Catalyst
Hyoun Woo Kim, | 한국물리학회 | 2007 ,
524
Resonance Fluorescence Spectra of Zn-substituted Myoglobin
Resonance Fluorescence Spectra of Zn-substituted Myoglobin
J. S. Ahn, | 한국물리학회 | 2007 ,
525
Effect of Ambient Ar Gas on the Composition Control and Crystalline Properties of TiNi Thin Films Fabricated by Using Pulsed Laser Deposition
Effect of Ambient Ar Gas on the Composition Control and Crystalline Properties of TiNi Thin Films Fabricated by Using Pulsed Laser Deposition
J. S. Ahn, | 한국물리학회 | 2007 ,
526
Progress of Physics Studies in the Hanbit Mirror Device
Progress of Physics Studies in the Hanbit Mirror Device
K.-I. You, | 한국물리학회 | 2006 ,
527
Electrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices
Electrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices
Chang Young Koo, | 한국물리학회 | 2007 ,
528
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Kyong-Jin Hwang, | 한국물리학회 | 2007 ,
529
CF₄-Based Neutral-Beam Etch Characteristics of Si and SiO₂Using a Low-Angle forward-Reflected Neutral-beam Etching System
CF₄-Based Neutral-Beam Etch Characteristics of Si and SiO₂Using a Low-Angle forward-Reflected Neutral-beam Etching System
D. H. Lee, | 한국물리학회 | 2006 ,
530
Integral Equation Approach to Correlations in a Two-Dimensional Two-Component Hard-Core Plasma
Integral Equation Approach to Correlations in a Two-Dimensional Two-Component Hard-Core Plasma
M. Joe, | 한국물리학회 | 2006 ,
처음이전48495051525354555657이후마지막