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35 Results:AA:DAE YEON KIM 0.140 sec.
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31
Reliability Issues and Role of Defects in High-k Dielectric HfO₂Devices
Reliability Issues and Role of Defects in High-k Dielectric HfO₂Devices
Joongoo Kang, | 한국물리학회 | 2007 ,
32
Influence of Exygen on the Electrical Properties of Aluninum-Doped Zine-Oxide thin Films
Influence of Exygen on the Electrical Properties of Aluninum-Doped Zine-Oxide thin Films
Se-Hyun Kim, | 한국물리학회 | 2006 ,
33
Application of Immersed Boundary Method for Flow Over Stationary and Oscillating Cylinders
Application of Immersed Boundary Method for Flow Over Stationary and Oscillating Cylinders
Dae Sung Lee., | 대한기계학회 | 2006 ,
34
InGaAs Nano-HEMT Devices for Milimeter-wave MMICs
InGaAs Nano-HEMT Devices for Milimeter-wave MMICs
Sung-Won Kim., | 대한전자공학회 | 2006 ,
35
High fт 30nm Triple-Gate In０.７GaAs HEMTs withDamage-Free SiO₂/SiNx Sidewall Process and BCB Planarization
High fт 30nm Triple-Gate In０.７GaAs HEMTs withDamage-Free SiO₂/SiNx Sidewall Process and BCB Planarization
Dae-Hyun Kim, Seong-Jin Yeon, Saegn-Sub Song, Jae, | 대한전자공학회 | 2004 ,
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