본문

  1. Home
202 Results:AA:SE JIN LEE 0.203 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
91
Expression of Tobacco cDNA Encoding Phytochelatin Synthase Promotes Tolerance to and Accumulation of Cd and As in Saccharomyces cerevisiae
Expression of Tobacco cDNA Encoding Phytochelatin Synthase Promotes Tolerance to and Accumulation of Cd and As in Saccharomyces cerevisiae
Young Jin Kim, | 한국식물학회(Adventitous Root Formation | 2005 ,
92
Gamma Radiation and Hormone Treatment as Tools to Reduce Salt Stress in Rice (Oryza sativa L.)
Gamma Radiation and Hormone Treatment as Tools to Reduce Salt Stress in Rice (Oryza sativa L.)
Myung Hwa Baek, | 한국식물학회(Adventitous Root Formation | 2006 ,
93
Two Novel Protein Kinase Genes, OsMSRPK1 and OsMSURPK2, Are Regulated by Diverse Environmental Stresses in Rice
Two Novel Protein Kinase Genes, OsMSRPK1 and OsMSURPK2, Are Regulated by Diverse Environmental Stresses in Rice
Mi Ok Lee, | 한국식물학회(Adventitous Root Formation | 2006 ,
94
Comparative Expression and Characterization of Dehydroascorbate Reductase cDNA from Transformed Sesame Hairy Roots using Real-Time RT-PCR
Comparative Expression and Characterization of Dehydroascorbate Reductase cDNA from Transformed Sesame Hairy Roots using Real-Time RT-PCR
Jae An Chun, | 한국식물학회(Adventitous Root Formation | 2006 ,
95
Rapid Upregulation of Dehyrin3 and Dehydrin4 in Response to Dehydration Is a Characteristic of Drought-Tolerant Genotypes in Barley
Rapid Upregulation of Dehyrin3 and Dehydrin4 in Response to Dehydration Is a Characteristic of Drought-Tolerant Genotypes in Barley
So Yon Park, | 한국식물학회(Adventitous Root Formation | 2006 ,
96
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
97
Color Correction in Portable-type Urine Analyzer
Color Correction in Portable-type Urine Analyzer
Jae Hyung Kim, | 한국전기전자재료학회 | 2003 ,
98
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Bok Hee Youn, | 한국전기전자재료학회 | 2003 ,
99
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Sang Yong Kim, | 한국전기전자재료학회 | 2003 ,
100
Polishing Mechanism of TEOS-CMP with High-temperature Slurry by Surface Analysis
Polishing Mechanism of TEOS-CMP with High-temperature Slurry by Surface Analysis
Nam Hoon Kim, | 한국전기전자재료학회 | 2005 ,
처음이전12345678910이후마지막