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13 Results:AA:DAE YEON KIM 0.921 sec.
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1
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Dae Yeon Kim., | 한국물리학회 | 2006 ,
2
Monitoring the Occurrence of Genetically Modified Soybean and Maize around Cultivated Fields and at a Grain Receiving Port in Korea
Monitoring the Occurrence of Genetically Modified Soybean and Maize around Cultivated Fields and at a Grain Receiving Port in Korea
Chang Gi Kim, | 한국식물학회(Adventitous Root Formation | 2006 ,
3
Investigation of the Alignment Phenomena on the a-C:H Thin Films by PECVD System using Ion-beam Alignment Method
Investigation of the Alignment Phenomena on the a-C:H Thin Films by PECVD System using Ion-beam Alignment Method
Chang Joon Park, | 한국전기전자재료학회 | 2005 ,
4
Analysis of ITO on Polymer Substrate by External Bending Force
Analysis of ITO on Polymer Substrate by External Bending Force
Jin Woo Han, | 한국전기전자재료학회 | 2005 ,
5
Liquid Crystal Alignment on the SiC Thin Film by the Ion Beam Exposure Method
Liquid Crystal Alignment on the SiC Thin Film by the Ion Beam Exposure Method
Chang Joon Park, | 한국전기전자재료학회 | 2005 ,
6
Liquid Crystal Alignment Effects on Nitrogen-doped Diamond like Carbon Layer by Ion Beam Alignment Method
Liquid Crystal Alignment Effects on Nitrogen-doped Diamond like Carbon Layer by Ion Beam Alignment Method
Jeong Min Han, | 한국전기전자재료학회 | 2008 ,
7
Regular Paper : A Study on Electro-optical Characteristics of the UV Aligned FFS Cell on the Organic Layer
Regular Paper : A Study on Electro-optical Characteristics of the UV Aligned FFS Cell on the Organic Layer
Jeong Min Han, | 한국전기전자재료학회 | 2008 ,
8
Luteolin Inhibits Extracellular Signal-Regulated Kinase Pathway Through Protease-Activated Receptors (-2 and -4) and Their Agonist Activity
Luteolin Inhibits Extracellular Signal-Regulated Kinase Pathway Through Protease-Activated Receptors (-2 and -4) and Their Agonist Activity
Sun-Hee Lee, | 한국생약학회 | 2007 ,
9
Reliability Issues and Role of Defects in High-k Dielectric HfO₂Devices
Reliability Issues and Role of Defects in High-k Dielectric HfO₂Devices
Joongoo Kang, | 한국물리학회 | 2007 ,
10
Influence of Exygen on the Electrical Properties of Aluninum-Doped Zine-Oxide thin Films
Influence of Exygen on the Electrical Properties of Aluninum-Doped Zine-Oxide thin Films
Se-Hyun Kim, | 한국물리학회 | 2006 ,
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