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821
The Structural and Electrical Properties of NiCr Alloy for the Bottom Electrode of High Dielectric (Ba,Sr)TiO3 (BST) Thin Films
The Structural and Electrical Properties of NiCr Alloy for the Bottom Electrode of High Dielectric (Ba,Sr)TiO3 (BST) Thin Films
Eung Min Lee, | 한국전기전자재료학회 | 2004 ,
822
Polar Anchoring Strength and Surface Ordering in NLC by the Washing Process on Rubbed Polymer Surfaces Containing Trifluoromethyl Moiety
Polar Anchoring Strength and Surface Ordering in NLC by the Washing Process on Rubbed Polymer Surfaces Containing Trifluoromethyl Moiety
Sang Keuk Lee, | 한국전기전자재료학회 | 2003 ,
823
TFD Device with Symmetrical Structure of Flexible Electrode Subject to Flexible Substrate
TFD Device with Symmetrical Structure of Flexible Electrode Subject to Flexible Substrate
Chan Jae Lee, | 한국전기전자재료학회 | 2003 ,
824
Fabrication of Novel Thin Film Diode with Multi-step Anodic Oxidation and Post Heat-treatment
Fabrication of Novel Thin Film Diode with Multi-step Anodic Oxidation and Post Heat-treatment
Sung Jei Hong, | 한국전기전자재료학회 | 2003 ,
825
Color Correction in Portable-type Urine Analyzer
Color Correction in Portable-type Urine Analyzer
Jae Hyung Kim, | 한국전기전자재료학회 | 2003 ,
826
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Bok Hee Youn, | 한국전기전자재료학회 | 2003 ,
827
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Ju Hyun Yoo, | 한국전기전자재료학회 | 2003 ,
828
Anomalous Subthreshold Characteristics of Shallow Trench - Isolated Submicron NMOSFET with Capped p - TEOS / SiN
Anomalous Subthreshold Characteristics of Shallow Trench - Isolated Submicron NMOSFET with Capped p - TEOS / SiN
Hyung J. Lee, | 한국전기전자재료학회 | 2003 ,
829
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Sang Yong Kim, | 한국전기전자재료학회 | 2003 ,
830
Electron Microscope Analyses of Self - aligned Hg Te Nanocrystallites Induced by Controlled Precipitation Technique
Electron Microscope Analyses of Self - aligned Hg Te Nanocrystallites Induced by Controlled Precipitation Technique
Man Jong Lee, | 한국전기전자재료학회 | 2003 ,
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