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801
Polar Anchoring Strength and Surface Ordering in NLC by the Washing Process on Rubbed Polymer Surfaces Containing Trifluoromethyl Moiety
Polar Anchoring Strength and Surface Ordering in NLC by the Washing Process on Rubbed Polymer Surfaces Containing Trifluoromethyl Moiety
Sang Keuk Lee, | 한국전기전자재료학회 | 2003 ,
802
TFD Device with Symmetrical Structure of Flexible Electrode Subject to Flexible Substrate
TFD Device with Symmetrical Structure of Flexible Electrode Subject to Flexible Substrate
Chan Jae Lee, | 한국전기전자재료학회 | 2003 ,
803
Fabrication of Novel Thin Film Diode with Multi-step Anodic Oxidation and Post Heat-treatment
Fabrication of Novel Thin Film Diode with Multi-step Anodic Oxidation and Post Heat-treatment
Sung Jei Hong, | 한국전기전자재료학회 | 2003 ,
804
Color Correction in Portable-type Urine Analyzer
Color Correction in Portable-type Urine Analyzer
Jae Hyung Kim, | 한국전기전자재료학회 | 2003 ,
805
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Bok Hee Youn, | 한국전기전자재료학회 | 2003 ,
806
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Ju Hyun Yoo, | 한국전기전자재료학회 | 2003 ,
807
Anomalous Subthreshold Characteristics of Shallow Trench - Isolated Submicron NMOSFET with Capped p - TEOS / SiN
Anomalous Subthreshold Characteristics of Shallow Trench - Isolated Submicron NMOSFET with Capped p - TEOS / SiN
Hyung J. Lee, | 한국전기전자재료학회 | 2003 ,
808
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Sang Yong Kim, | 한국전기전자재료학회 | 2003 ,
809
Electron Microscope Analyses of Self - aligned Hg Te Nanocrystallites Induced by Controlled Precipitation Technique
Electron Microscope Analyses of Self - aligned Hg Te Nanocrystallites Induced by Controlled Precipitation Technique
Man Jong Lee, | 한국전기전자재료학회 | 2003 ,
810
X-ray Response Characteristic of Zn in the Polycrystalline Cd1-xZnxTe Detector for Digital Radiography
X-ray Response Characteristic of Zn in the Polycrystalline Cd1-xZnxTe Detector for Digital Radiography
Sang Sik Kang, | 한국전기전자재료학회 | 2003 ,
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