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Characterization and Design Consideration of 80-nm Self-Aligned N-/P-Channel I-MOS Devices
Characterization and Design Consideration of 80-nm Self-Aligned N-/P-Channel I-MOS Devices
Woo Young Choi, Jong Duk Lee, Byung Gook Park, | 대한전자공학회 | 2006 ,
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