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1
Assessment of riparian buffers for reducing pollution according to land-cover pattern using RS and GIS
Assessment of riparian buffers for reducing pollution according to land-cover pattern using RS and GIS
Sung-Ryong Ha, | 대한원격탐사학회 | 2006 ,
2
Effects of Strain and Interface Roughness Between an AlN Buffer Layer and a ZnO Film Grown by Using Radio-Frequency Magnetron Sputtering
Effects of Strain and Interface Roughness Between an AlN Buffer Layer and a ZnO Film Grown by Using Radio-Frequency Magnetron Sputtering
M. S. Yi., | 한국물리학회 | 2006 ,
3
The Structural Properties of GaN Grown on Si Substrates by Using Various Annealing Conditions for the AlN Buffer Layers
The Structural Properties of GaN Grown on Si Substrates by Using Various Annealing Conditions for the AlN Buffer Layers
D. H. Shin., | 한국물리학회 | 2006 ,
4
Long Length YBCO Coated Conductors Prepared by an MOD Process on Buffered Metallic Tapes
Long Length YBCO Coated Conductors Prepared by an MOD Process on Buffered Metallic Tapes
Kokchae Chung., | 한국초전도 저온공학회 | 2006 ,
5
The Study of Different Buffer Structure on Ni-W Tape for SmBCO Coated Conductor
The Study of Different Buffer Structure on Ni-W Tape for SmBCO Coated Conductor
T. H. Kim., | 한국초전도 저온공학회 | 2006 ,
6
Time Evolution of a High temperature GaN Epilayer Grown on a Low-temperature GaN Buffer Layer using a Low-pressure MOCVD
Time Evolution of a High temperature GaN Epilayer Grown on a Low-temperature GaN Buffer Layer using a Low-pressure MOCVD
Kyunghwa Chang, | 한국전기전자재료학회 | 2007 ,
7
Buffered Oxide Etch 세정에 의한 다결정 실리콘 TFT의 전기적 특성 개선
Buffered Oxide Etch 세정에 의한 다결정 실리콘 TFT의 전기적 특성 개선
남영묵, 배성찬, 최시영, | 대한전자공학회 | 2004 ,
8
버퍼 삽입 위치 및 배선 제한을 고려한 Buffered 배선 트리 구성
버퍼 삽입 위치 및 배선 제한을 고려한 Buffered 배선 트리 구성
정동식, 김덕환, 임종석, | 대한전자공학회 | 2003 ,
9
최소화된 Power line noise와 Feedthrough current를 갖는 저 전력 SDRAM Output Buffer
최소화된 Power line noise와 Feedthrough current를 갖는 저 전력 SDRAM Output Buffer
유재희, | 대한전자공학회 | 2002 ,
10
Growth and Characterizationof Al₂O₃Thin Films for the Buffer Insulator in Pt/SrBi₂Nb₂O0/Al₂O₃/Si Ferroelectric Gate Oxide Structure
Growth and Characterizationof Al₂O₃Thin Films for the Buffer Insulator in Pt/SrBi₂Nb₂O0/Al₂O₃/Si Ferroelectric Gate Oxide Structure
Hoon Sang Choi,Geun-Sik Lim,Jong Han Lee, | 대한금속.재료학회 | 2003 ,
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