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1
Software reengineering
Software reengineering
Arnold, Robert S., 005.12-A757s | IEEE Computer Soci | 1992 005.12-A757s,
2
Test generation for VLSI chips : Tutorial
Test generation for VLSI chips : Tutorial
Agrawal, Vishwani D., 569.3-V822t | IEEE Computer Soci | 1988 569.3-V822t,
3
(the) Test access port and boundaryscan architecture
(the) Test access port and boundaryscan architecture
Maunder, Colin M., 569-M451t | IEEE Computer Soci | 1990 569-M451t,
4
Bridging faults and IDDQ testing
Bridging faults and IDDQ testing
Malaiya, Yashwant K., 569-M236b | IEEE Computer Soci | 1992 569-M236b,
5
Image data compression : Block truncation coding
Image data compression : Block truncation coding
Dasarathy, Belur V., 004.74-D229i | IEEE Computer Society Press | 1995 004.74-D229i,
6
Artificial neural networks : Forecasting time series
Artificial neural networks : Forecasting time series
Vemuri, V. Rao, 005.754-V446a | IEEE Computer Society Press | 1994 005.754-V446a,
7
Monitoring and debugging of distributed real-time systems
Monitoring and debugging of distributed real-time systems
Tsai, Jeffrey J. P., 003.8-T877m | IEEE Computer Society Press | 1998 003.8-T877m,
8
Software System Design : Description and Analysis
Software System Design : Description and Analysis
Riddle, William E., 005.12-R542s | IEEE Computer Society | 1982 005.12-R542s,
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