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1 Results:AA:SETH SHARAD C PP:IEEE COMPUTER SOCI AA:AGRAWAL, VISHWANI D. 0.78 sec.
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Test generation for VLSI chips : Tutorial
Test generation for VLSI chips : Tutorial
Agrawal, Vishwani D., 569.3-V822t | IEEE Computer Soci | 1988 569.3-V822t,
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