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1
Robust flight control design with handling qualities constraints using scheduled linear dynamic inversion and loop-shaping
Robust flight control design with handling qualities constraints using scheduled linear dynamic inversion and loop-shaping
Wichai Siwakosit, | Institute of Electrical and Electronics Engineers | 2000 ,
2
Smooth Handoff 지원을 위한 빠른 인증 알고리즘
Smooth Handoff 지원을 위한 빠른 인증 알고리즘
김인수 ( In Su Kim ), | 한국정보처리학회 | 2002 ,
3
공유 메모리 다중 프로세서 시스템을 위한 가변 스케줄링
공유 메모리 다중 프로세서 시스템을 위한 가변 스케줄링
강오한 ( Oh Han Kang ), | 한국정보처리학회 | 2000 ,
4
컴퓨터시스템 : 버스 기반의 대칭형 다중프로세서 시스템을 위한 태스크 스케줄링 기법
컴퓨터시스템 : 버스 기반의 대칭형 다중프로세서 시스템을 위한 태스크 스케줄링 기법
강오한 ( Oh Han Kang ), | 한국정보처리학회 | 2002 ,
5
분산 및 병렬처리 : PC 클러스터에서 스케줄링 기법의 구현
분산 및 병렬처리 : PC 클러스터에서 스케줄링 기법의 구현
강오한 ( Oh Han Kang ), | 한국정보처리학회 | 2004 ,
6
Mass Transfer Modeling in Closed Systems for Food Packaging, Particulate Foods and Controlled Release Technology
Mass Transfer Modeling in Closed Systems for Food Packaging, Particulate Foods and Controlled Release Technology
Jung-H. Han, | 한국식품과학회 | 2004 ,
7
Simulating Migration Models and Determining the Releasing Rate of Potassium Sorbate from Antimicrobial Plastic Film
Simulating Migration Models and Determining the Releasing Rate of Potassium Sorbate from Antimicrobial Plastic Film
Jung H. Han, | 한국식품과학회 | 2000 ,
8
Is being Good Better Than Being Cheap, or is Being Cheap Better Than Being Good?
Is being Good Better Than Being Cheap, or is Being Cheap Better Than Being Good?
H. Hansen, | Association for Consumer Research | 2004 ,
9
A Variety of Activation Methods Employed in “Activated-Ion” Electron Capture Dissociation Mass Spectrometry: A Test against Bovine Ubiquitin 7+ Ions
A Variety of Activation Methods Employed in “Activated-Ion” Electron Capture Dissociation Mass Spectrometry: A Test against Bovine Ubiquitin 7+ Ions
Oh, Han-Bin, | 대한화학회 | 2006 ,
10
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Chih Hang Tung, | 대한전자공학회 | 2003 ,
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