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Anodization of Aluminium Samples in Boric Acid Solutions by Optical Interferometry Techniques
Anodization of Aluminium Samples in Boric Acid Solutions by Optical Interferometry Techniques
K. Habib, | 한국부식방식학회(구)한국부식학회 | 2005 ,
2
Non-Destructive Evaluation of Semiconductor Package by Electronic Speckle Pattern Interferometry
Non-Destructive Evaluation of Semiconductor Package by Electronic Speckle Pattern Interferometry
Koungsuk Kim, Kisoo Kang, Seungtack Jung, | 대한기계학회 | 2005 ,
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