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871
Enhanced Hole Injections in Organic Light Emitting Diode using Rhodium Oxide Coated Anode
Enhanced Hole Injections in Organic Light Emitting Diode using Rhodium Oxide Coated Anode
Soo Young Kim, | 대한전자공학회 | 2005 ,
872
A Study on the Passive Microvalve Applicable to Drainage Device for Glaucoma
A Study on the Passive Microvalve Applicable to Drainage Device for Glaucoma
Tae Seok Sim, | 대한전자공학회 | 2002 ,
873
Design Sensitivity in Quasi-One-Dimensional Silicon-Based Photonic Crystalline Waveguides
Design Sensitivity in Quasi-One-Dimensional Silicon-Based Photonic Crystalline Waveguides
Takeshi Kinoshita, | 대한전자공학회 | 2003 ,
874
Design of Broad Band Amplifier Using Feedback Technique
Design of Broad Band Amplifier Using Feedback Technique
Tae-Shin Kang, | 대한전자공학회 | 2003 ,
875
Progress in Novel Oxides for Gate Dielectrics and Surface Passivation of GaN/A1GaN Heterostructure Field Effect Transistors
Progress in Novel Oxides for Gate Dielectrics and Surface Passivation of GaN/A1GaN Heterostructure Field Effect Transistors
C.R.Abernathy, | 대한전자공학회 | 2003 ,
876
Analysis of Electrical Properties of Ti/Pt/Au Schottky Contacts on (n)GaAs Formed by Electron Beam Deposition and RF Sputtering
Analysis of Electrical Properties of Ti/Pt/Au Schottky Contacts on (n)GaAs Formed by Electron Beam Deposition and RF Sputtering
B K Sehgal, | 대한전자공학회 | 2003 ,
877
Analog CMOS Performance Degradation due to Edge Direct Tunnelling(EDT) Current in sub-100nm Technology
Analog CMOS Performance Degradation due to Edge Direct Tunnelling(EDT) Current in sub-100nm Technology
Navakanta Bhat, | 대한전자공학회 | 2003 ,
878
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Chih Hang Tung, | 대한전자공학회 | 2003 ,
879
Compact Gate Capacitance Model with Polysilicon Depletion Effect for MOS Device
Compact Gate Capacitance Model with Polysilicon Depletion Effect for MOS Device
H. Abebe, | 대한전자공학회 | 2007 ,
880
MOSFET Model HiSIM Based on Surface-Potential Description for Enabling Accurate RF-CMOS Design
MOSFET Model HiSIM Based on Surface-Potential Description for Enabling Accurate RF-CMOS Design
M.Miura-Mattausch, | 대한전자공학회 | 2004 ,
처음이전83848586878889909192이후마지막
1
Bolet? de Biodiversidad de Chile
Centro de Estudios de Biodiversidad [, ]
2
Contact Dermatitis (01051873)
Blackwell Publishing Limited [, ]
3
Dred Scott decision & the Declaration of Independence
Great Neck Publishing [, ]
4
Entertainment Design
Primedia Business Magazines & Media Inc. [, ]
5
International Journal of Knowledge Content Development & Technology
건국대학교 지식콘텐츠연구소 [, ]
6
International Journal of Knowledge Content Development & Technology
건국대학교 지식콘텐츠연구소 [인문, ]
7
Journal of Adult Development
Kluwer Academic Publishers [, ]
8
Martin, Plaintiff in Error, v. Mott, Defendant in Error
Great Neck Publishing [, ]
9
New Directions for Child & Adolescent Development
Jossey-Bass Publishers [, ]
10
Percentage Distribution of 1989-90 Beginning Students by Highest Degree
US Department of Education [, ]
11
Rambouillet Decree
Great Neck Publishing [, ]
12
Statement on Soviet Decision to Remove Cuban Missiles
Great Neck Publishing [, ]
13
Supreme Court Debates
Congressional Digest Corp [, ]
14
Welt des Islams
Brill Academic Publishers [, ]