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781
Time-Characteristics of ZrO₂ Thin films Deposited by Reactive Magnetron Sputtering
Time-Characteristics of ZrO₂ Thin films Deposited by Reactive Magnetron Sputtering
Jae Hwan Ko, | 한국물리학회 | 2007 ,
782
Deposition and Characterization of Low-dielectric-Constant SiOC(-H) Thin Films for Interlayer Dielectrics in Multilevel Interconnections
Deposition and Characterization of Low-dielectric-Constant SiOC(-H) Thin Films for Interlayer Dielectrics in Multilevel Interconnections
Rangaswamy Navamathavan, | 한국물리학회 | 2007 ,
783
Synthesis, Structural Characterization, and Photoluminescence Properties of SiOχ Nanowires Prepared Using a Palladium Catalyst
Synthesis, Structural Characterization, and Photoluminescence Properties of SiOχ Nanowires Prepared Using a Palladium Catalyst
Hyoun Woo Kim, | 한국물리학회 | 2007 ,
784
Characteristics of ZrCo Alloy for the Storage of Hydrogen Isotopes
Characteristics of ZrCo Alloy for the Storage of Hydrogen Isotopes
Myung-Hwa Shim, | 한국물리학회 | 2006 ,
785
Use of Neural Network to Characterize Temperature Effects on Deposition Rate of PECVD-silicon Nitride Thin Films
Use of Neural Network to Characterize Temperature Effects on Deposition Rate of PECVD-silicon Nitride Thin Films
Byungwhan Kim, | 한국물리학회 | 2006 ,
786
Investigation on Silver Electroplating Process for ITER Thermal Shield
Investigation on Silver Electroplating Process for ITER Thermal Shield
Mu-Young Ahn, | 한국물리학회 | 2006 ,
787
DetailedDesign of ITER Vacuum Vessel Ports and In-Wal Shielding
DetailedDesign of ITER Vacuum Vessel Ports and In-Wal Shielding
Duck-Hoi Kim, | 한국물리학회 | 2006 ,
788
Electrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices
Electrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices
Chang Young Koo, | 한국물리학회 | 2007 ,
789
Effective Electrochemical Gating of Hole Transport in Aligned Single-Walled Carbon Nanotube Network Thin film Transistors
Effective Electrochemical Gating of Hole Transport in Aligned Single-Walled Carbon Nanotube Network Thin film Transistors
Bonghyun Park, | 한국물리학회 | 2007 ,
790
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Kyong-Jin Hwang, | 한국물리학회 | 2007 ,
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