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721
Outer Fruit Features Related with Fruit Quality in 'Niitaka' Pear Fruits
Outer Fruit Features Related with Fruit Quality in 'Niitaka' Pear Fruits
Yong-Hee Kwon, | 한국원예학회 | 2006 ,
722
A Qualitative Assessment of Korean and American Consumers Decision Making Styles
A Qualitative Assessment of Korean and American Consumers Decision Making Styles
Vanessa Prier Jackson, | 대한가정학회 | 2006 ,
723
Microbial degradation of munttion wastes by mixed and singe species culture
Microbial degradation of munttion wastes by mixed and singe species culture
Kwon Sung-Hyun, 539.9-K98m-TD | University of Southern California | 1997 539.9-K98m-TD,
724
Evolution of Shear Texture according to Shear Strain Ratio in Rolled FCC Metal Sheets
Evolution of Shear Texture according to Shear Strain Ratio in Rolled FCC Metal Sheets
Hyo Tae Jeong, Su Dong Park, Tae Kwon Ha, | Korean Institute of Metals and Materials | 2006 ,
725
System Level Architecture Evaluation and Optimization an Industrial Case Study with AMBA3 AXI : an Industrial Case Study with AMBA3 AXI
System Level Architecture Evaluation and Optimization an Industrial Case Study with AMBA3 AXI : an Industrial Case Study with AMBA3 AXI
Jong Eun Lee, Woo-Cheol Kwon, Tae-Hun Kim, Eui-Yo, | 대한전자공학회 | 2005 ,
726
Optimal Trajectory Generation for Biped Robots Walking Up-and-Down Stairs
Optimal Trajectory Generation for Biped Robots Walking Up-and-Down Stairs
Ohung Kwon, Kweon Soo Jeon, Jong Hyeon Park, | 대한기계학회 | 2006 ,
727
Trajectory Generation and Dynamic Control of Planar Biped Robots with Curved Soles
Trajectory Generation and Dynamic Control of Planar Biped Robots with Curved Soles
Je Sung Yeon, Ohung Kwon, Jong Hyeon Park, | 대한기계학회 | 2006 ,
728
Neural Robust Control for Perturbed Crane Systems
Neural Robust Control for Perturbed Crane Systems
Hyun Cheol Cho, M. Sami Fadali, Young Jin Lee, Kw, | 대한기계학회 | 2006 ,
729
Time Evolution of a High temperature GaN Epilayer Grown on a Low-temperature GaN Buffer Layer using a Low-pressure MOCVD
Time Evolution of a High temperature GaN Epilayer Grown on a Low-temperature GaN Buffer Layer using a Low-pressure MOCVD
Kyunghwa Chang, | 한국전기전자재료학회 | 2007 ,
730
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Bong-Kyu Joung, | 한국전기전자재료학회 | 2007 ,
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