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691
공단지역 주변 토양 중 PCBs 농도분포 및 발생원 추정에 관한 연구
공단지역 주변 토양 중 PCBs 농도분포 및 발생원 추정에 관한 연구
박석운(Seok Un Park), | 대한환경공학회 | 2007 ,
692
시간 개념을 고려한 전과정평가 방법
시간 개념을 고려한 전과정평가 방법
H. Phungrassami,, | 대한환경공학회 | 2007 ,
693
The Concentration Of PCCD/Fs In Flue Gas And Soil Collected In The Vicinity Of Various Incinerators, Korea
The Concentration Of PCCD/Fs In Flue Gas And Soil Collected In The Vicinity Of Various Incinerators, Korea
Kyoung Soo Kim, | 대한환경공학회 | 2007 ,
694
Analysis of 1/(integral) Noise in Fully Depleted n-channel Double Gate SOI MOSFET
Analysis of 1/(integral) Noise in Fully Depleted n-channel Double Gate SOI MOSFET
Alok Kushwaha, | 대한전자공학회 | 2005 ,
695
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Tina Mangla, | 대한전자공학회 | 2005 ,
696
Analysis of 1/(integral) Noise in Fully Depleted n-channel Double Gate SOI MOSFET
Analysis of 1/(integral) Noise in Fully Depleted n-channel Double Gate SOI MOSFET
Alok Kushwaha, | 대한전자공학회 | 2002 ,
697
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Physics-based Algorithm Implementation for Characterization of Gate-dielectric Engineered MOSFETs including Quantization Effects
Tina Mangla, | 대한전자공학회 | 2002 ,
698
MRAM Technology for High Density Memory Application
MRAM Technology for High Density Memory Application
Chang-Shuk Kim, | 대한전자공학회 | 2002 ,
699
Analysis of Electrical Properties of Ti/Pt/Au Schottky Contacts on (n)GaAs Formed by Electron Beam Deposition and RF Sputtering
Analysis of Electrical Properties of Ti/Pt/Au Schottky Contacts on (n)GaAs Formed by Electron Beam Deposition and RF Sputtering
B K Sehgal, | 대한전자공학회 | 2003 ,
700
Optimization of InA1As/InGaAs HEMT Performance for Microwave Frequency Applications and Reliability
Optimization of InA1As/InGaAs HEMT Performance for Microwave Frequency Applications and Reliability
Ritesh Gupta, | 대한전자공학회 | 2004 ,
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