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521
Calculation of the Tunneling Current and the Noise for a Radio-Frequency Single Electron Transistor Based on a Green's function Approach
Calculation of the Tunneling Current and the Noise for a Radio-Frequency Single Electron Transistor Based on a Green's function Approach
J. H. Oh, | 한국물리학회 | 2007 ,
522
Synthesis,Structure and Dielectric Properties of BaTiO Nanoparticles
Synthesis,Structure and Dielectric Properties of BaTiO Nanoparticles
Jong-Ho park, | 한국물리학회 | 2007 ,
523
Synthesis, Structural Characterization, and Photoluminescence Properties of SiOχ Nanowires Prepared Using a Palladium Catalyst
Synthesis, Structural Characterization, and Photoluminescence Properties of SiOχ Nanowires Prepared Using a Palladium Catalyst
Hyoun Woo Kim, | 한국물리학회 | 2007 ,
524
Hetero-Epitaxial Growth of LiNbO₃ Thin Film on GaN.Al₂O₃ by Pulsed Laser Deposition
Hetero-Epitaxial Growth of LiNbO₃ Thin Film on GaN.Al₂O₃ by Pulsed Laser Deposition
Yu-Jin Kang, | 한국물리학회 | 2007 ,
525
Dielectric Properties of Artificially Textured (Ba0.5Sr0.5)TiO₃Thin Film Prepared by Pulsed Laser Deposition
Dielectric Properties of Artificially Textured (Ba0.5Sr0.5)TiO₃Thin Film Prepared by Pulsed Laser Deposition
Jae-Yeol Hwang, | 한국물리학회 | 2007 ,
526
Photon-Stimulated H Desorption from Several H/Si(001) Surfaces for Resistless Lithography
Photon-Stimulated H Desorption from Several H/Si(001) Surfaces for Resistless Lithography
Cheolho Jeon, | 한국물리학회 | 2007 ,
527
Determination of the KMC Parameters for Indium Diffusion in Silicon Substrates Via an Ab-Initio Calculation
Determination of the KMC Parameters for Indium Diffusion in Silicon Substrates Via an Ab-Initio Calculation
Kwan-Sun Yoon, | 한국물리학회 | 2007 ,
528
Machining of the KSTAR TF Coil Structure
Machining of the KSTAR TF Coil Structure
K. H. Hong, | 한국물리학회 | 2006 ,
529
Effective Electrochemical Gating of Hole Transport in Aligned Single-Walled Carbon Nanotube Network Thin film Transistors
Effective Electrochemical Gating of Hole Transport in Aligned Single-Walled Carbon Nanotube Network Thin film Transistors
Bonghyun Park, | 한국물리학회 | 2007 ,
530
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Kyong-Jin Hwang, | 한국물리학회 | 2007 ,
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