34
Kim Hye Won,,
| Elsevier Inc |
2008
,
35
Device characterization and Fabrication Issues for Ferroelectric Gate Field Effect Transistor Device
Yu , Byoung-Gon,
| 대한전자공학회 |
2002
,
한글
English
日本語
中文
Русский
עברית
ไทย
Française
Deutsch
Español