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11
Thermal Stability and Adhesion Improvement of Cu(Ag)/Mo Bilayer Metallization in Large-Area TFT-LCDs
Thermal Stability and Adhesion Improvement of Cu(Ag)/Mo Bilayer Metallization in Large-Area TFT-LCDs
H. M. Lee, | 한국물리학회 | 2007 ,
12
CF₄-Based Neutral-Beam Etch Characteristics of Si and SiO₂Using a Low-Angle forward-Reflected Neutral-beam Etching System
CF₄-Based Neutral-Beam Etch Characteristics of Si and SiO₂Using a Low-Angle forward-Reflected Neutral-beam Etching System
D. H. Lee, | 한국물리학회 | 2006 ,
13
The Effect of Synthesis Conditions on the Formation of Titanate Nanotubes
The Effect of Synthesis Conditions on the Formation of Titanate Nanotubes
M. Qamar, | 한국물리학회 | 2006 ,
14
Design and Fabrication of the Double-Sided Silicon Microstrip Sensor
Design and Fabrication of the Double-Sided Silicon Microstrip Sensor
H. Park, | 한국물리학회 | 2006 ,
15
Magnetotransport Measurements on an AlGaN/GaN Two-Dimensional Electron System
Magnetotransport Measurements on an AlGaN/GaN Two-Dimensional Electron System
Jyun-Ying Lin, | 한국물리학회 | 2006 ,
16
Formation of MgO Powders by Using a Combustion Method and the Thermodynamics of Gas Adsorption
Formation of MgO Powders by Using a Combustion Method and the Thermodynamics of Gas Adsorption
D. H. Seo, | 한국물리학회 | 2006 ,
17
Physical and Electrical Characteristics of Atomic-Layer-deposited Hf-Silicate Thin Films Using Hf[N(CH₃)(C₂H5)]₄and SiH[N(CH₃)₂]₃ Precursors
Physical and Electrical Characteristics of Atomic-Layer-deposited Hf-Silicate Thin Films Using Hf[N(CH₃)(C₂H5)]₄and SiH[N(CH₃)₂]₃ Precursors
K. B. Chung, | 한국물리학회 | 2006 ,
18
Strain-Polarization Coupling Manifested by Impedance Spectroscopy
Strain-Polarization Coupling Manifested by Impedance Spectroscopy
S. H. Kim, | 한국물리학회 | 2006 ,
19
Roughness Analysis of GaN Surfaces at Different Annealing Temperatures for an AIN Buffer Layer
Roughness Analysis of GaN Surfaces at Different Annealing Temperatures for an AIN Buffer Layer
M. K. Bae, | 한국물리학회 | 2007 ,
20
Temperature Changes Caused by 13-MeV Proton Irradiation at the Interface of a Pyrex Glass and a Silicon Wafer
Temperature Changes Caused by 13-MeV Proton Irradiation at the Interface of a Pyrex Glass and a Silicon Wafer
E. H. KIM, | 한국물리학회 | 2006 ,
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