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141
Proceedings international conference on Wafer Scale Integration
Proceedings international conference on Wafer Scale Integration
Jain, Vljay K, 569-J25p | IEEE | 1997 569-J25p,
142
Oversampling delta-sigma data converters : theory, design, and simulation
Oversampling delta-sigma data converters : theory, design, and simulation
Candy, James C, 569.8-C219o | IEEE | 1992 569.8-C219o,
143
Object-oriented databases
Object-oriented databases
Nahouraii, Ez, 005.74-N154o | IEEE | 1991 005.74-N154o,
144
VLSI Algorithms and Architectures : Fundamentals
VLSI Algorithms and Architectures : Fundamentals
Ranganathan, N, 566-R196v | IEEE | 1993 566-R196v,
145
Computational Electromagnetics
Computational Electromagnetics
Miller, Edmund K, 560-M647c | IEEE Press | 1992 560-M647c,
146
Nonvolatile semiconductor memories : technologies, design, and applications
Nonvolatile semiconductor memories : technologies, design, and applications
Hu, Chenming, 569.4-H874n | IEEE control systems society | 1991 569.4-H874n,
147
Test generation for VLSI chips : Tutorial
Test generation for VLSI chips : Tutorial
Agrawal, Vishwani D., 569.3-V822t | IEEE Computer Soci | 1988 569.3-V822t,
148
(the) Test access port and boundaryscan architecture
(the) Test access port and boundaryscan architecture
Maunder, Colin M., 569-M451t | IEEE Computer Soci | 1990 569-M451t,
149
Modern power electronics : Evolution, technology, and applications
Modern power electronics : Evolution, technology, and applications
Bose, B.K., 564.8-B743m | IEEE control systems society | 1992 564.8-B743m,
150
Principles of expert systems
Principles of expert systems
Gupta, Amar, 004.73-G977p | IEEE control systems society | 1988 004.73-G977p,
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1
IEEE Region 10 Conference
대한전자공학회 [, ]
2
IEEE Region 10 Conference
대한전자공학회 [공학, ]