신경주학교 도서관

5 Results:SS:LIFETIME 0.78 sec.

Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Bong-Kyu Joung, | 한국전기전자재료학회 | 2007 ,

Uncertain Lifetimes and the Implications of Social Security in an Endogenous Communication Model
KIYOUNG LEE, | The Korean Economic Association | 2000 ,

Predicting Lifetime Reliability of an Existing Bridge with or without Maintenance
Seung-Ie Yang, | 대한토목학회 | 2003 ,

Elastic-Plastic Stress analysis and Fatigue lifetime Prediction of Cross-Bores in AutoFrettaged Pressure Vessels
Seung-Kee Koh, | 대한기계학회 | 2000 ,

Effects of Texture ans Grain Structure on Electromigration Lifetime of Al-Cu Interconnects
Young Bae Park,Duk Won Lee, | 대한금속.재료학회 | 2001 ,