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1
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Trade-off Characteristic between Gate Length Margin and Hot Carrier Lifetime by Considering ESD on NMOSFETs of Submicron Technology
Bong-Kyu Joung, | 한국전기전자재료학회 | 2007 ,
2
Uncertain Lifetimes and the Implications of Social Security in an Endogenous Communication Model
Uncertain Lifetimes and the Implications of Social Security in an Endogenous Communication Model
KIYOUNG LEE, | The Korean Economic Association | 2000 ,
3
Predicting Lifetime Reliability of an Existing Bridge with or without Maintenance
Predicting Lifetime Reliability of an Existing Bridge with or without Maintenance
Seung-Ie Yang, | 대한토목학회 | 2003 ,
4
Elastic-Plastic Stress analysis and Fatigue lifetime Prediction of Cross-Bores in AutoFrettaged Pressure Vessels
Elastic-Plastic Stress analysis and Fatigue lifetime Prediction of Cross-Bores in AutoFrettaged Pressure Vessels
Seung-Kee Koh, | 대한기계학회 | 2000 ,
5
Effects of Texture ans Grain Structure on Electromigration Lifetime of Al-Cu Interconnects
Effects of Texture ans Grain Structure on Electromigration Lifetime of Al-Cu Interconnects
Young Bae Park,Duk Won Lee, | 대한금속.재료학회 | 2001 ,
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