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1
A Scanning Tunneling Microscopy Tip with a Sable Atomic Structure
A Scanning Tunneling Microscopy Tip with a Sable Atomic Structure
Yeong-Cheol Kim, and David N. Seidman, | 대한금속.재료학회 | 2004 ,
2
An Electrochemical Etching Procedure for Fabricating Scanning Tunneling Microscopy and Atom-Probe Field-Ion Microscopy Tips
An Electrochemical Etching Procedure for Fabricating Scanning Tunneling Microscopy and Atom-Probe Field-Ion Microscopy Tips
Yeong-Cheol Kim,David N Seidman, | 대한금속.재료학회 | 2003 ,
3
Characterization of the dopant Dependence of Ni-silicide on a SOI Substrate for a Nano-Scale CMOSFET
Characterization of the dopant Dependence of Ni-silicide on a SOI Substrate for a Nano-Scale CMOSFET
Soon-Yen Jung, | 한국물리학회 | 2007 ,
4
A Study on the Parameter Estimation of DURUMI-II for the Fixed Right Elevator Using Flight Test Data
A Study on the Parameter Estimation of DURUMI-II for the Fixed Right Elevator Using Flight Test Data
Wook-Je Park., | 대한기계학회 | 2006 ,
5
Fabrication of Monodisperse Silica Spheres Using Statistical Design of Experiments
Fabrication of Monodisperse Silica Spheres Using Statistical Design of Experiments
Hye-Jin Won, Young-Shin Pyo, Sang-Soon Oh, Yeong-, | Korean Institute of Metals and Materials | 2006 ,
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