본문

  1. Home
7 Results:AA:EOM W 0.46 sec.
RSS 
Multilingual
 高级搜索
 新货搜索
选定的打印 Select Export to Excel
1
Comparison between SAGE and cDNA Microarray for Quantitative Accuracy in Transcript Profiling Analyses
Comparison between SAGE and cDNA Microarray for Quantitative Accuracy in Transcript Profiling Analyses
Eun Mi Eom, | 한국식물학회(Adventitous Root Formation | 2006 ,
2
Property ImProvement of Aluminum-Oxide Thin Films Deposited under Photon Radiation by Using Atomic Layer Deposition
Property ImProvement of Aluminum-Oxide Thin Films Deposited under Photon Radiation by Using Atomic Layer Deposition
Hyeong Joon Kim, | 한국물리학회 | 2006 ,
3
Coexistence of the Kondo and the Superconductiong Proximity Effects in AuFe/Al Loops
Coexistence of the Kondo and the Superconductiong Proximity Effects in AuFe/Al Loops
Jonghwa Eom, | 한국물리학회 | 2006 ,
4
Development of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Development of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Jinwon Park, | 한국물리학회 | 2006 ,
5
Nonlinear FES Control of Knee Joint by Inversely Compensated Feedback System
Nonlinear FES Control of Knee Joint by Inversely Compensated Feedback System
Gwang-Moon Eom, | 제어자동화시스템공학회 | 2006 ,
6
Coexistence of the Kondo and the Superconducting Proximity Effects in AuFe/Al Loops
Coexistence of the Kondo and the Superconducting Proximity Effects in AuFe/Al Loops
Eom, Jonghwa, | 한국물리학회 | 2006 ,
7
Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Park, Jinwon, | 한국물리학회 | 2006 ,
처음1마지막