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721
Size Analysis of CdSe/ZnS Quantum Dots in Aqueous Solution by Using Laser-Induced Breakdown Detection
Size Analysis of CdSe/ZnS Quantum Dots in Aqueous Solution by Using Laser-Induced Breakdown Detection
Ji-woong Kim., | 한국물리학회 | 2006 ,
722
Photo-Neutrons Produced at the Pohang Neutron Facility Based on an Electron Linac
Photo-Neutrons Produced at the Pohang Neutron Facility Based on an Electron Linac
K. Devan., | 한국물리학회 | 2006 ,
723
Acoustic Emission Source Analysis of Vacuum Plasma Sprayed CoNiCrAlY Coatings
Acoustic Emission Source Analysis of Vacuum Plasma Sprayed CoNiCrAlY Coatings
Ku-hyun Lee., | 한국물리학회 | 2006 ,
724
Titania Nanofibers Srepared by Electrospinning
Titania Nanofibers Srepared by Electrospinning
Deuk Yong Lee., | 한국물리학회 | 2006 ,
725
Characteristics of 1.56-πm­ Quantum-Dot-Distributed Feedback Lasers
Characteristics of 1.56-πm­ Quantum-Dot-Distributed Feedback Lasers
Dong Sup Kim., | 한국물리학회 | 2006 ,
726
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Dae Yeon Kim., | 한국물리학회 | 2006 ,
727
Nonvolatile Memory Characteristics in Metal-Oxide-Semiconductors Containing Metal Nanoparticles Fabricated by Using a Unique Laser Irradiation Method
Nonvolatile Memory Characteristics in Metal-Oxide-Semiconductors Containing Metal Nanoparticles Fabricated by Using a Unique Laser Irradiation Method
Jungyup Yang., | 한국물리학회 | 2006 ,
728
Interface Analysis of an AlGaAs Multilayer System by Using Spectroscopic Ellipsometry
Interface Analysis of an AlGaAs Multilayer System by Using Spectroscopic Ellipsometry
T. H. Ghong., | 한국물리학회 | 2006 ,
729
Electrical Properties of the ZnO Nanowire Transistor and Its Analysis with Equivalent Circuit model
Electrical Properties of the ZnO Nanowire Transistor and Its Analysis with Equivalent Circuit model
C. Y. Yim., | 한국물리학회 | 2006 ,
730
Study on Crystallization of α-Si Measured by Imaging Spectroscopic Ellipsometry
Study on Crystallization of α-Si Measured by Imaging Spectroscopic Ellipsometry
A. J. Choi., | 한국물리학회 | 2006 ,
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