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541
Current Scaling and Electron Heating in a GaN/AlGaN Two-Dimensional Electron System
Current Scaling and Electron Heating in a GaN/AlGaN Two-Dimensional Electron System
Kuang Yao Chen, | 한국물리학회 | 2007 ,
542
Resistive Switching Characteristics of HfO₂ Grown by Atomic Layer Deposition
Resistive Switching Characteristics of HfO₂ Grown by Atomic Layer Deposition
Kyong-Rae Kim, | 한국물리학회 | 2007 ,
543
Metal Precursor Effects on Deposition and Interfacial Characteristics of HfO₂ Dielectrics Grown by Atomic Layer Deposition
Metal Precursor Effects on Deposition and Interfacial Characteristics of HfO₂ Dielectrics Grown by Atomic Layer Deposition
In-Sung Park, | 한국물리학회 | 2007 ,
544
Growth and Magnetic Properties of Ge₁-xMnx Single Crystals
Growth and Magnetic Properties of Ge₁-xMnx Single Crystals
SungKyu Kim, | 한국물리학회 | 2007 ,
545
Characteristics of ZrCo Alloy for the Storage of Hydrogen Isotopes
Characteristics of ZrCo Alloy for the Storage of Hydrogen Isotopes
Myung-Hwa Shim, | 한국물리학회 | 2006 ,
546
Use of Neural Network to Characterize Temperature Effects on Deposition Rate of PECVD-silicon Nitride Thin Films
Use of Neural Network to Characterize Temperature Effects on Deposition Rate of PECVD-silicon Nitride Thin Films
Byungwhan Kim, | 한국물리학회 | 2006 ,
547
Electron-Impact Collisions in Magnetized Plasmas
Electron-Impact Collisions in Magnetized Plasmas
Hong-Min Kim, | 한국물리학회 | 2006 ,
548
Effective Electrochemical Gating of Hole Transport in Aligned Single-Walled Carbon Nanotube Network Thin film Transistors
Effective Electrochemical Gating of Hole Transport in Aligned Single-Walled Carbon Nanotube Network Thin film Transistors
Bonghyun Park, | 한국물리학회 | 2007 ,
549
Fabrication and Characterization of Nano-Hole-Arrayed Pt Electrode on Silicon for CMOS Integrated Non-Disposable Biosensor Applications
Fabrication and Characterization of Nano-Hole-Arrayed Pt Electrode on Silicon for CMOS Integrated Non-Disposable Biosensor Applications
Hye-Kyoung Seo, | 한국물리학회 | 2007 ,
550
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Characterization and Improvement of Reverse Leakage Current of Shallow Silicided Junction for Sub-100 nm CMOS TEchnology Utilizing N₂PAI
Kyong-Jin Hwang, | 한국물리학회 | 2007 ,
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