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501
Naked Exclusion
Naked Exclusion
Segal, I. R., | American Economic Assn | 2000 ,
502
Identification of Aster Yellows Phytoplasma in Dendranthema grandiflorum
Identification of Aster Yellows Phytoplasma in Dendranthema grandiflorum
Bong Nam Chung, | 한국식물병리학회 | 2001 ,
503
Role of Intergenic and 3'-Proximal Noncoding Regions in Coat Protein Expression and Replication of Barley yellow dwarf virus PAV
Role of Intergenic and 3'-Proximal Noncoding Regions in Coat Protein Expression and Replication of Barley yellow dwarf virus PAV
Jae Sun Moon, | 한국식물병리학회 | 2001 ,
504
The Effect of Legal Environment on Voluntary Disclosure : Evidence from Management Earnings Forecasts Issued in U.S. and Canadian Markets
The Effect of Legal Environment on Voluntary Disclosure : Evidence from Management Earnings Forecasts Issued in U.S. and Canadian Markets
Baginski, S. P., | American Accounting Assn | 2002 ,
505
The Economic Dilution of Employee Stock Options: Diluted EPS for Valuation and Financial Reporting
The Economic Dilution of Employee Stock Options: Diluted EPS for Valuation and Financial Reporting
Core, J. E., | American Accounting Assn | 2002 ,
506
Using Budgets for Performance Evaluation : Effects of Resource Allocation and Horizontal Information Asymmetry on Budget Proposals, Budget Slack, and Performance
Using Budgets for Performance Evaluation : Effects of Resource Allocation and Horizontal Information Asymmetry on Budget Proposals, Budget Slack, and Performance
Fisher, J. G., | American Accounting Assn | 2002 ,
507
The Effects of Pro Forma Earnings Disclosures on Analysts' and Nonprofessional Investors' Equity Valuation Judgments
The Effects of Pro Forma Earnings Disclosures on Analysts' and Nonprofessional Investors' Equity Valuation Judgments
Frederickson, J. R., | American Accounting Assn | 2004 ,
508
Regular Paper : Stress Dependence of Thermal Stability of Nickel Silicide for Nano MOSFETs
Regular Paper : Stress Dependence of Thermal Stability of Nickel Silicide for Nano MOSFETs
Ying Ying Zhang, | 한국전기전자재료학회 | 2008 ,
509
Regular Paper : Nature of Surface and Bulk Defects Induced by Epitaxial Growth in Epitaxial Layer Transfer Wafers
Regular Paper : Nature of Surface and Bulk Defects Induced by Epitaxial Growth in Epitaxial Layer Transfer Wafers
Suk Goo Kim, | 한국전기전자재료학회 | 2005 ,
510
Regular Paper : X-ray Sensitivity of Hybrid-type Sensor based on CaWO4-Selenium for Digital X-ray Imager
Regular Paper : X-ray Sensitivity of Hybrid-type Sensor based on CaWO4-Selenium for Digital X-ray Imager
Ji Koon Park, | 한국전기전자재료학회 | 2005 ,
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