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491
A study on the Plasma Parameters and Characteristics of Carbon-Doped Silicon-Oxide Films by Using MTMS/O₂ and He Plasmas
A study on the Plasma Parameters and Characteristics of Carbon-Doped Silicon-Oxide Films by Using MTMS/O₂ and He Plasmas
Min Sung Kang., | 한국물리학회 | 2006 ,
492
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Impact of Si Impurities in HfO₂ : Threshold Voltage Problems in Poly-Si/HfO₂ Gate Stacks
Dae Yeon Kim., | 한국물리학회 | 2006 ,
493
Hydrothermal Reaction for the Preparation of La0.7Ca0.3MnO₃ and La0.7Sr0.3MnO₃
Hydrothermal Reaction for the Preparation of La0.7Ca0.3MnO₃ and La0.7Sr0.3MnO₃
Sang M. Lee., | 한국물리학회 | 2006 ,
494
Electron Emission from a Carbon Nanotube Frown in a Hole by Using a Triode Plasma-Enhanced Chemical Vapor Deposition
Electron Emission from a Carbon Nanotube Frown in a Hole by Using a Triode Plasma-Enhanced Chemical Vapor Deposition
Kyu Chang Park., | 한국물리학회 | 2006 ,
495
Stability and Electronic Structure of Aluminate Nanotubes
Stability and Electronic Structure of Aluminate Nanotubes
Yong-ju Kang., | 한국물리학회 | 2006 ,
496
Realization of a Low-Threshold-Voltage Field Emitter by Using Figh-Quality ZnO Nano-Tetrapods
Realization of a Low-Threshold-Voltage Field Emitter by Using Figh-Quality ZnO Nano-Tetrapods
Mina Jung., | 한국물리학회 | 2006 ,
497
Determination of an Optimized Alq?? Layer Thickness in Organic Light-Emitting Diodes by Using Microcavity Effects
Determination of an Optimized Alq?? Layer Thickness in Organic Light-Emitting Diodes by Using Microcavity Effects
Boo-young Jung., | 한국물리학회 | 2006 ,
498
Annealing Effects on the Photoluminescence of Amorphous Silicon-Nitride Films
Annealing Effects on the Photoluminescence of Amorphous Silicon-Nitride Films
Changhun Ko., | 한국물리학회 | 2006 ,
499
Optical Anisotropy of Microstructure-Controlled TiO?? Films Fabricated by Glancing-Angle Deposition(GLAD)
Optical Anisotropy of Microstructure-Controlled TiO?? Films Fabricated by Glancing-Angle Deposition(GLAD)
Seouk-hoon Woo., | 한국물리학회 | 2006 ,
500
Poing-Defect Study of CuAISe₂(112) Layers Post-Annealed in Various Ambient
Poing-Defect Study of CuAISe₂(112) Layers Post-Annealed in Various Ambient
Kwang-joon Hong., | 한국물리학회 | 2006 ,
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