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401
Study on Electrical Properties of X-ray Sensor Based on CsI:Na-Selenium Film
Study on Electrical Properties of X-ray Sensor Based on CsI:Na-Selenium Film
Ji Koon Park, | 한국전기전자재료학회 | 2004 ,
402
Preparation of Low-Temperature Fired PZT Thick Films on Si by Screen Printing
Preparation of Low-Temperature Fired PZT Thick Films on Si by Screen Printing
Chae Il Cheon, | 한국전기전자재료학회 | 2004 ,
403
A New EST with Dual Trench Gate Electrode (DTG-EST)
A New EST with Dual Trench Gate Electrode (DTG-EST)
Dae Won Kim, | 한국전기전자재료학회 | 2004 ,
404
Roles of Phosphoric Acid in Slurry for Cu and TaN CMP
Roles of Phosphoric Acid in Slurry for Cu and TaN CMP
Sang Yong Kim, | 한국전기전자재료학회 | 2004 ,
405
Rubbing Angle Effects on the Electro-Optic Characteristics of In-Plane Switching Liquid Crystal Display
Rubbing Angle Effects on the Electro-Optic Characteristics of In-Plane Switching Liquid Crystal Display
Hyang Yul Kim, | 한국전기전자재료학회 | 2004 ,
406
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Bok Hee Youn, | 한국전기전자재료학회 | 2003 ,
407
Reproducible Chemical Mechanical Polishing Characteristics of Shallow Trench Isolation Structure using High Selectivity Slurry
Reproducible Chemical Mechanical Polishing Characteristics of Shallow Trench Isolation Structure using High Selectivity Slurry
So Young Jeong, | 한국전기전자재료학회 | 2003 ,
408
Failure Analysis for High via Resistance by HDP CVD System for IMD Layer
Failure Analysis for High via Resistance by HDP CVD System for IMD Layer
Sang Yong Kim, | 한국전기전자재료학회 | 2003 ,
409
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Ju Hyun Yoo, | 한국전기전자재료학회 | 2003 ,
410
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Sang Yong Kim, | 한국전기전자재료학회 | 2003 ,
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