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351
Regular Paper : A Compact and Fast Measurement System for the Detection of Small Capacitance
Regular Paper : A Compact and Fast Measurement System for the Detection of Small Capacitance
Young Shin Woo, | 한국전기전자재료학회 | 2002 ,
352
Regular Paper : Phase Stability of Bi-2212 and Bi-2223 Thin Films Prepared by IBS Technique
Regular Paper : Phase Stability of Bi-2212 and Bi-2223 Thin Films Prepared by IBS Technique
Sung Ho Yang, | 한국전기전자재료학회 | 2002 ,
353
Regular Paper : Determination of the Inelastic Cross Sections for C3F8 Molecule by Electron Swarm Study
Regular Paper : Determination of the Inelastic Cross Sections for C3F8 Molecule by Electron Swarm Study
Byung Hoon Jeon, | 한국전기전자재료학회 | 2002 ,
354
Electrical Properties of ( Ba , Sr ) TiO3 Thin Films Deposited on RuO2 Electrode
Electrical Properties of ( Ba , Sr ) TiO3 Thin Films Deposited on RuO2 Electrode
Chi Sun Park, | 한국전기전자재료학회 | 2001 ,
355
LIGBT with Dual Cathode for Improving Breakdown Characteristics
LIGBT with Dual Cathode for Improving Breakdown Characteristics
Ey Goo Kang, | 한국전기전자재료학회 | 2001 ,
356
Temperature - Dependent Photoluminescence from Er-implanted undoped and Mg-doped GaN
Temperature - Dependent Photoluminescence from Er-implanted undoped and Mg-doped GaN
Sang Sig Kim, | 한국전기전자재료학회 | 2001 ,
357
Regular Paper / Optimal Sputtering Parameters of Transparent Conducting ITO Films Deposited on PET Substrates
Regular Paper / Optimal Sputtering Parameters of Transparent Conducting ITO Films Deposited on PET Substrates
Hyun Hoo Kim, | 한국전기전자재료학회 | 2001 ,
358
Regular Paper / A Study on Pumping Effect of Oxygen in Polysilicon Gate Etching
Regular Paper / A Study on Pumping Effect of Oxygen in Polysilicon Gate Etching
Nam Hoon Kim, | 한국전기전자재료학회 | 2001 ,
359
Polishing Mechanism of TEOS-CMP with High-temperature Slurry by Surface Analysis
Polishing Mechanism of TEOS-CMP with High-temperature Slurry by Surface Analysis
Nam Hoon Kim, | 한국전기전자재료학회 | 2005 ,
360
Operational Characteristics of Flux-Lock Type SFCL using Series Resonance
Operational Characteristics of Flux-Lock Type SFCL using Series Resonance
Sung Hun Lim, | 한국전기전자재료학회 | 2005 ,
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