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331
Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Gwi Su Shin, | 한국전기전자재료학회 | 2004 ,
332
The Thickness Dependence of Edge Effect in Thin Insulating Films
The Thickness Dependence of Edge Effect in Thin Insulating Films
Jeong Myen Song, | 한국전기전자재료학회 | 2004 ,
333
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
334
Electrochemical Properties end Estimation on Active Material LiMnO2 Synthesis for Secondary
Electrochemical Properties end Estimation on Active Material LiMnO2 Synthesis for Secondary
Sung Dong Wee, | 한국전기전자재료학회 | 2004 ,
335
Dielectric Properties of Zr-doped (Ba,Sr,Ca)TiO3 Thick Films for Microwave Phase Shifters
Dielectric Properties of Zr-doped (Ba,Sr,Ca)TiO3 Thick Films for Microwave Phase Shifters
Sung Gap Lee, | 한국전기전자재료학회 | 2004 ,
336
A New EST with Dual Trench Gate Electrode (DTG-EST)
A New EST with Dual Trench Gate Electrode (DTG-EST)
Dae Won Kim, | 한국전기전자재료학회 | 2004 ,
337
TFD Device with Symmetrical Structure of Flexible Electrode Subject to Flexible Substrate
TFD Device with Symmetrical Structure of Flexible Electrode Subject to Flexible Substrate
Chan Jae Lee, | 한국전기전자재료학회 | 2003 ,
338
Fabrication of Novel Thin Film Diode with Multi-step Anodic Oxidation and Post Heat-treatment
Fabrication of Novel Thin Film Diode with Multi-step Anodic Oxidation and Post Heat-treatment
Sung Jei Hong, | 한국전기전자재료학회 | 2003 ,
339
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Microstructural , Dielectric and Electrical Properties of ( Pb , La , Ce ) TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Ju Hyun Yoo, | 한국전기전자재료학회 | 2003 ,
340
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Sang Yong Kim, | 한국전기전자재료학회 | 2003 ,
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