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161
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Sang Yong Kim, | 한국전기전자재료학회 | 2003 ,
162
Regular paper : Fabrication Technology of the Focusing Grating Coupler using Single - step Electron Beam Lithography
Regular paper : Fabrication Technology of the Focusing Grating Coupler using Single - step Electron Beam Lithography
Tae Youb Kim, | 한국전기전자재료학회 | 2003 ,
163
Regular Paper : A New SOI LIGBT Structure with Improved Latch - Up Performance
Regular Paper : A New SOI LIGBT Structure with Improved Latch - Up Performance
Woong Je Sung, | 한국전기전자재료학회 | 2002 ,
164
Regular Paper : A Small Scaling Lateral Trench IGBT with Improved Electrical Characteristics for Smart Power IC
Regular Paper : A Small Scaling Lateral Trench IGBT with Improved Electrical Characteristics for Smart Power IC
Seung Hyun Moon, | 한국전기전자재료학회 | 2002 ,
165
A Novel EST with Trench Electrode to Immunize snab - back Effect and to Obtain High Blocking Voltage
A Novel EST with Trench Electrode to Immunize snab - back Effect and to Obtain High Blocking Voltage
Ey Goo Kang, | 한국전기전자재료학회 | 2002 ,
166
Microstructural and Piezoelectric Characteristics of PSN - PMN - PZT Ceramics Produced by Attrition Milling
Microstructural and Piezoelectric Characteristics of PSN - PMN - PZT Ceramics Produced by Attrition Milling
Ju Hyun Yoo, | 한국전기전자재료학회 | 2002 ,
167
Regular Paper : Simulation of a Novel Lateral Trench Electrode IGBT with Improved Latch - up and Forward Blocking Characteristics
Regular Paper : Simulation of a Novel Lateral Trench Electrode IGBT with Improved Latch - up and Forward Blocking Characteristics
Ey Goo Kang, | 한국전기전자재료학회 | 2002 ,
168
Regular Paper : A Compact and Fast Measurement System for the Detection of Small Capacitance
Regular Paper : A Compact and Fast Measurement System for the Detection of Small Capacitance
Young Shin Woo, | 한국전기전자재료학회 | 2002 ,
169
Regular Paper : Phase Stability of Bi-2212 and Bi-2223 Thin Films Prepared by IBS Technique
Regular Paper : Phase Stability of Bi-2212 and Bi-2223 Thin Films Prepared by IBS Technique
Sung Ho Yang, | 한국전기전자재료학회 | 2002 ,
170
Regular Paper : Determination of the Inelastic Cross Sections for C3F8 Molecule by Electron Swarm Study
Regular Paper : Determination of the Inelastic Cross Sections for C3F8 Molecule by Electron Swarm Study
Byung Hoon Jeon, | 한국전기전자재료학회 | 2002 ,
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