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151
Study on Electrical Properties of X-ray Sensor Based on CsI:Na-Selenium Film
Study on Electrical Properties of X-ray Sensor Based on CsI:Na-Selenium Film
Ji Koon Park, | 한국전기전자재료학회 | 2004 ,
152
Roles of Phosphoric Acid in Slurry for Cu and TaN CMP
Roles of Phosphoric Acid in Slurry for Cu and TaN CMP
Sang Yong Kim, | 한국전기전자재료학회 | 2004 ,
153
Zinc Sulfide-selenium X-ray Detector for Digital Radiography
Zinc Sulfide-selenium X-ray Detector for Digital Radiography
Ji Koon Park, | 한국전기전자재료학회 | 2003 ,
154
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Bok Hee Youn, | 한국전기전자재료학회 | 2003 ,
155
Preparation and Characterization of β-C3N4 in Presence of Seed Carbon Nitride Films Deposited by Laser - Electric Discharge Method
Preparation and Characterization of β-C3N4 in Presence of Seed Carbon Nitride Films Deposited by Laser - Electric Discharge Method
J. I. Kim, | 한국전기전자재료학회 | 2003 ,
156
X-ray Response Characteristic of Zn in the Polycrystalline Cd1-xZnxTe Detector for Digital Radiography
X-ray Response Characteristic of Zn in the Polycrystalline Cd1-xZnxTe Detector for Digital Radiography
Sang Sik Kang, | 한국전기전자재료학회 | 2003 ,
157
Regular paper : Effect of Dry Process on Dielectric Properties of PZT Thin Films Prepared by Sol - Gel Process
Regular paper : Effect of Dry Process on Dielectric Properties of PZT Thin Films Prepared by Sol - Gel Process
Min Ho Bae, | 한국전기전자재료학회 | 2003 ,
158
Regular Paper / Characterization of Helicon Plasma by H2 Gas Discharge and Fabrication of Diamond Thin Films
Regular Paper / Characterization of Helicon Plasma by H2 Gas Discharge and Fabrication of Diamond Thin Films
June Won Hyun, | 한국전기전자재료학회 | 2001 ,
159
Synthesis and Characterization of Y2O3:Eu Fine Particle
Synthesis and Characterization of Y2O3:Eu Fine Particle
Ji Koon Park, | 한국전기전자재료학회 | 2005 ,
160
Magnetic Abrasive Polishing for Internal Face of STS Tube using Sludge Abrasive Grain
Magnetic Abrasive Polishing for Internal Face of STS Tube using Sludge Abrasive Grain
Hee Nam Kim, | 한국전기전자재료학회 | 2005 ,
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Helsinki Monitor
Martinus Nijhoff [, ]