MARC

 008050713s2000        ULKa    a                          KOR
■022    ▼a12296368
■245    ▼a0.18㎛  CMOS  Technolngy에서  인터커넥트  라인에  의한  지연시간의  게이트  폭에  대한  의존성  분석▼d장명준,  이희덕  공저
■260    ▼a서울▼b대한전자공학회▼c2000.
■300    ▼app.  1-8
■653    ▼a0.18㎛▼aCMOS▼aTECHNOLNGY에서▼a라인▼a지연▼a게이트▼a대한▼a의존성
■700    ▼a장명준,  이희덕
■773    ▼t전자공학회논문지SD(Semiconductor  and  Devices)  :  반도체▼g제37권  제11호  (2000  11)▼d2000,  11
■SIS    ▼aS009622▼b60014354▼h8▼s2

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