본문

  1. Home
2 Results:SS:ELECTRONICENGINEERING 0.83 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
1
(The)Optimal burn-in procedures for the two-mixed weibull distribution in time-to-failure patterns
(The)Optimal burn-in procedures for the two-mixed weibull distribution in time-to-failure patterns
Kim, Kui Nam, 569.43-K49o-TD | Colorado state university | 1994 569.43-K49o-TD,
2
Flow Routing in Compound Channels by Apparent Shear Force Muskinhum-Cunge Methods
Flow Routing in Compound Channels by Apparent Shear Force Muskinhum-Cunge Methods
Chun, Moo-Kab, 569-C559f-TD | West Virginia University | 1994 569-C559f-TD,
처음1마지막