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(The)Optimal burn-in procedures for the two-mixed weibull distribution in time-to-failure patterns
(The)Optimal burn-in procedures for the two-mixed weibull distribution in time-to-failure patterns
Kim, Kui Nam, 569.43-K49o-TD | Colorado state university | 1994 569.43-K49o-TD,
2
Optical Logic Circuits Using Multiple Quantum-Well Modulators and Pulse-Doped Fets
Optical Logic Circuits Using Multiple Quantum-Well Modulators and Pulse-Doped Fets
Lee, Yoo Jong, 569.3-L482o-TD | Colorado State University | 1997 569.3-L482o-TD,
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