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Interfacial Electrical/Dielectric Characterization in Low Temperature Polycrystalline Si
Interfacial Electrical/Dielectric Characterization in Low Temperature Polycrystalline Si
Jinha Hwang, | 한국마이크로전자및 패키징학회 | 2005 ,
2
Electrical and dielectric properties, and accelerated aging characteristics of lanthania doped zinc oxide varistors
Electrical and dielectric properties, and accelerated aging characteristics of lanthania doped zinc oxide varistors
Nahm, Choon-Woo, | 한국전기전자재료학회 | 2007 ,
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