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1 Results:SS:DEFECTS PP:한국마이크로전자및 패키징학회 AA:KANG-WOON LEE, YONG-IL KIM, WON-JONG LEE 0.109 sec.
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Kang-Woon Lee, Yong-Il Kim, WOn-Jong Lee, | 한국마이크로전자및 패키징학회 | 2005 ,