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1
Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis, October 25-28, 1994, Philadelphia, Pennsylvania, USA : sponsored by the IEEE Signal Processing Society and the IEEE Philadelphia Section.
Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis, October 25-28, 1994, Philadelphia, Pennsylvania, USA : sponsored by the IEEE Signal Processing Society and the IEEE Philadelphia Section.
IEEE-SP International Symposium on Time-Frequency, 621.3822-I'22p-R | Institute of Electrical and Electronics Engineers:Available from IEEE Service Center | 1984 621.3822-I'22p-R,
2
Proceedings 1988 IEEE international conference on robotics and automation, 3 : April 24-29, 1988, Franklin PlaZA Hotel Philadelphia, Pennsylvania
Proceedings 1988 IEEE international conference on robotics and automation, 3 : April 24-29, 1988, Franklin PlaZA Hotel Philadelphia, Pennsylvania
IEEE robotics and automation society, 559.962-R666p-R | Institute of Electrical and Electr | 1988 559.962-R666p-R,
3
Proceedings 1988 IEEE international conference on robotics and automation, 2 : April 24-29, 1988, Franklin PlaZA Hotel Philadelphia, Pennsylvania
Proceedings 1988 IEEE international conference on robotics and automation, 2 : April 24-29, 1988, Franklin PlaZA Hotel Philadelphia, Pennsylvania
IEEE robotics and automation society, 559.962-R666p-R | Institute of Electrical and Electr | 1988 559.962-R666p-R,
4
Proceedings 1988 IEEE international conference on robotics and automation, 1 : April 24-29, 1988, Franklin PlaZA Hotel Philadelphia, Pennsylvania
Proceedings 1988 IEEE international conference on robotics and automation, 1 : April 24-29, 1988, Franklin PlaZA Hotel Philadelphia, Pennsylvania
IEEE robotics and automation society, 559.962-R666p-R | Institute of Electrical and Electr | 1988 559.962-R666p-R,
5
IROS 96, 3 : Robotic intelligence interacting with dynamic worlds, November 4-8, 1996 Senri Life Science Center, Osaka, Japan
IROS 96, 3 : Robotic intelligence interacting with dynamic worlds, November 4-8, 1996 Senri Life Science Center, Osaka, Japan
IEEE Industrial Electronics Society, 559.9076-I22i-R | Institute of Electrical and Electr | 1996 559.9076-I22i-R,
6
IROS 96, 2 : Robotic intelligence interacting with dynamic worlds, November 4-8, 1996 Senri Life Science Center, Osaka, Japan
IROS 96, 2 : Robotic intelligence interacting with dynamic worlds, November 4-8, 1996 Senri Life Science Center, Osaka, Japan
IEEE Industrial Electronics Society, 559.9076-I22i-R | Institute of Electrical and Electr | 1996 559.9076-I22i-R,
7
IROS 96, 1 : Robotic intelligence interacting with dynamic worlds, November 4-8, 1996 Senri Life Science Center, Osaka, Japan
IROS 96, 1 : Robotic intelligence interacting with dynamic worlds, November 4-8, 1996 Senri Life Science Center, Osaka, Japan
IEEE Industrial Electronics Society, 559.9076-I22i-R | Institute of Electrical and Electr | 1990 559.9076-I22i-R,
8
Proceedings of the IEEE third international symposium on spread spectrum techniques and applications, Vol 2-2, July 4-6, 1994, University of Oulu, Oulu, Finland
Proceedings of the IEEE third international symposium on spread spectrum techniques and applications, Vol 2-2, July 4-6, 1994, University of Oulu, Oulu, Finland
IEEE Finland Section, 567.06-I22p-R | Institute of Electrical and Electr | 1994 567.06-I22p-R,
9
Proceedings of the IEEE third international symposium on spread spectrum techniques and applications, Vol 1-2, July 4-6, 1994, University of Oulu, Oulu, Finland
Proceedings of the IEEE third international symposium on spread spectrum techniques and applications, Vol 1-2, July 4-6, 1994, University of Oulu, Oulu, Finland
IEEE Finland Section, 567.06-I22p-R | Institute of Electrical and Electr | 1994 567.06-I22p-R,
10
Proceeding international test conference 1993 : Designing, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Proceeding international test conference 1993 : Designing, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
IEEE Computer Society Test Technology Technical C, 569.306-I22p-R | Institute of Electrical and Electr | 1993 569.306-I22p-R,
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