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Proceeding international test conference 1993 : Designing, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Proceeding international test conference 1993 : Designing, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
IEEE Computer Society Test Technology Technical C, 569.306-I22p-R | Institute of Electrical and Electr | 1993 569.306-I22p-R,
2
(1993) IEEE international symposium on circuits and systems vol.2-4 : Analog circuits and filters, May 3-6, 1993, Sheraton Chicago hotel & towers Chicago, IL
(1993) IEEE international symposium on circuits and systems vol.2-4 : Analog circuits and filters, May 3-6, 1993, Sheraton Chicago hotel & towers Chicago, IL
IEEE, 569.306-I22i-R | Institute of Electrical and Electr | 1993 569.306-I22i-R,
3
(1993) IEEE international symposium on circuits and systems vol.4-4 : Networks, systems and applications, May 3-6, 1993, Sheraton Chicago hotel & towers Chicago, IL
(1993) IEEE international symposium on circuits and systems vol.4-4 : Networks, systems and applications, May 3-6, 1993, Sheraton Chicago hotel & towers Chicago, IL
IEEE, 569.306-I22i-R | Institute of Electrical and Electr | 1993 569.306-I22i-R,
4
(1995) IEEE international symposium on circuits and systems vol. 3 : April 30 - May 3, 1995, Seattle, Washington
(1995) IEEE international symposium on circuits and systems vol. 3 : April 30 - May 3, 1995, Seattle, Washington
IEEE, 569.306-I22i-R | Institute of Electrical and Electr | 1995 569.306-I22i-R,
5
(1995) IEEE international symposium on circuits and systems vol. 2 : April 30 - May 3, 1995, Seattle, Washington
(1995) IEEE international symposium on circuits and systems vol. 2 : April 30 - May 3, 1995, Seattle, Washington
IEEE, 569.306-I'22i-R | Institute of Electrical and Electr | 1995 569.306-I'22i-R,
6
(1995) IEEE international symposium on circuits and systems vol. 1 : April 30 - May 3, 1995, Seattle, Washington
(1995) IEEE international symposium on circuits and systems vol. 1 : April 30 - May 3, 1995, Seattle, Washington
IEEE, 569.306-I22i-R | Institute of Electrical and Electr | 1995 569.306-I22i-R,
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