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1
Fault-tolerance and reliability techniques for high-density random-access memories
Fault-tolerance and reliability techniques for high-density random-access memories
Chakraborty, Kanad., 566.43-C435f | Prentice Hall | 2002 566.43-C435f,
2
Testing and testable design of high-density random-access memories
Testing and testable design of high-density random-access memories
Mazumder, Pinaki, 566.4-M476t | Kluwer Academic publishers | 1996 566.4-M476t,
3
메모리 커패서터용 Pb(Zrx Ti1-x)O3 강유전체 박막의 제작과 특성
메모리 커패서터용 Pb(Zrx Ti1-x)O3 강유전체 박막의 제작과 특성
장지근, 566.432-장78메 | 집문당 | 1996 566.432-장78메,
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