1
International Electron Devices Meeting, 569.3-I'61i-R
| Institute of Electrical & Electronics Engineers |
1999
569.3-I'61i-R,
2
IEEE Control Systems Society, 569.93-I`22p-R
| IEEE Control System Society |
1987
569.93-I`22p-R,
3
IEEE Control Systems Society, 569.93-I`22p-R
| IEEE Control System Society |
1987
569.93-I`22p-R,
4
IEEE Control Systems Society, 569.93-I`22p-R
| IEEE Control System Society |
1987
569.93-I`22p-R,
5
IEEE Computer Society Test Technology Technical C, 569.306-I22p-R
| Institute of Electrical and Electr |
1993
569.306-I22p-R,
6
Huang, Ho-Chung, 569.06-H874i-R
| IEEE Service Center |
1990
569.06-H874i-R,
7
IEEE Service Center, 569.9406-I22p-R
| Institute of Electrical and Electr |
1994
569.9406-I22p-R,
8
IEEE Service Center, 569.9406-I22p-R
| Institute of Electrical and Electr |
1994
569.9406-I22p-R,
9
IEEE Service Center, 569.9406-I22p-R
| Institute of Electrical and Electr |
1994
569.9406-I22p-R,
10
IEEE Service Center, 569.9406-I22p-R
| Institute of Electrical and Electr |
1994
569.9406-I22p-R,
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- IEEE Service Center (4+)
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- IEEE Computer Society Test Technology Technical C (1+)
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- Institute of Electrical and Electr (10+)
- IEEE (7+)
- IEEE Control System Society (3+)
- Institute of Electrical & Electronics Engineers (1+)
- IEEE Service Center (1+)
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