본문

  1. Home
7 Results:AA:SUK-HO CHOI PP:한국물리학회 0.109 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
1
Time-Integrated and Time-Resolved Photoluminescence Properties of Si Nanocrystal/SiO₂ Multilayers Grown by Ion-Beam Sputtering
Time-Integrated and Time-Resolved Photoluminescence Properties of Si Nanocrystal/SiO₂ Multilayers Grown by Ion-Beam Sputtering
Sung Kim, | 한국물리학회 | 2007 ,
2
Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Min Choul Kim, | 한국물리학회 | 2007 ,
3
Nonvolatile Memory Devices Fabricated by using Colloidal Ni Nanocrystals
Nonvolatile Memory Devices Fabricated by using Colloidal Ni Nanocrystals
Kwang Soo Seol, | 한국물리학회 | 2007 ,
4
Structural and Optical Characterization of Ge Nanocrystals Showing Large Nonvolatile Memories in Metal-Oxide-Semiconductor Structures
Structural and Optical Characterization of Ge Nanocrystals Showing Large Nonvolatile Memories in Metal-Oxide-Semiconductor Structures
Sung Kim, | 한국물리학회 | 2006 ,
5
Nonvolatile Memory Properties of Thin Oxides with Single-and Multi-Layered Si Namocrystals Obtained by Ion Beam Sputtering
Nonvolatile Memory Properties of Thin Oxides with Single-and Multi-Layered Si Namocrystals Obtained by Ion Beam Sputtering
Sung Kim, | 한국물리학회 | 2006 ,
6
Optical Characterization of Ge Quantum Dots Grown by Using Rapid Thermal Chemical Vapor Deposition
Optical Characterization of Ge Quantum Dots Grown by Using Rapid Thermal Chemical Vapor Deposition
Min Choul Kim., | 한국물리학회 | 2006 ,
7
Nonvolatile Memory Properties of Thin Oxides with Single- and Multi-Layered Si Nanocrystals Obtained by Ion Beam Sputtering
Nonvolatile Memory Properties of Thin Oxides with Single- and Multi-Layered Si Nanocrystals Obtained by Ion Beam Sputtering
Kim, Sung, | 한국물리학회 | 2006 ,
처음1마지막