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Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Min Choul Kim, | 한국물리학회 | 2007 ,
2
Optical Characterization of Ge Quantum Dots Grown by Using Rapid Thermal Chemical Vapor Deposition
Optical Characterization of Ge Quantum Dots Grown by Using Rapid Thermal Chemical Vapor Deposition
Min Choul Kim., | 한국물리학회 | 2006 ,
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