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1
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Shin, Hui-youn, | 한국물리학회 | 2006 ,
2
The Growth Characteristics of a GaN Layer on a Cone-Shaped Patterned Sapphire Substrate by TEM Observation
The Growth Characteristics of a GaN Layer on a Cone-Shaped Patterned Sapphire Substrate by TEM Observation
Hui-Youn Shin, | 한국물리학회 | 2007 ,
3
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Hui-Youn Shin, | 한국물리학회 | 2006 ,
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